Zero-Error Systems

Zero-Error Systems (ZES) offers cutting-edge high reliability semiconductor integrated circuits (ICs) that optimize performance, cost and power consumption. ZES addresses the power reliability and data integrity issues of space electronics by protecting Commercial Off the Shelf (COTS) semiconductor devices from malfunction with their patented radiation hardened by design technologies.

Radiation-Hardened ICs for COTS protection

ZES’ LDAP IC, ZES100 is an integrated solution designed to detect major Single-Event Latchup (SEL) and μ-SEL in target devices  MCU/FPGA/ASIC) and subsequently provide a recovery (Power-cycling). It can be used to protect power supply and Commercial-Off-The-Shelf (COTS) devices from anomalous current due to SEL in Space applications.  Other ICs include Radiation-Hardened Point-of-Load, Voters and Latching Current Limiters.

Radiation Tolerant System on Module

ZSOM is a family of ZES’ Radiation-Tolerant System-on-Modules (SoM) for processing platforms that leverage Power-reliability and Data-integrity solutions to protect commercial
off-the-shelf (COTS) components from radiation effects such as Single-Event-Latchup
(SEL) and Single-Event-Upset (SEU). These modules enable a quick and reliable payload development platform for space-based applications. Options for MCU or FPGA based modules are available featuring ARM Cortex or AMD Zynq devices.